MIL-STD-750, “Test Methods for Semiconductor Devices,” and several of it’s subsections have recently been updated. Compliance with the changes is expected to be completed by June 13, 2013.
MIL-STD-750F is modified by the new Change 1. It is the overview document for the series which establishes uniform test methods for testing the environmental, physical, and electrical characteristics semiconductor devices. The change notice adds paragraph 4.1.3, to define acceptable international sinusoidal pulse input wave frequency.
MIL-STD-750-1 covers Environmental Tests 1000 through 1999. The change notice 1 is more extensive, modifying paragraphs 13, 13.1.1, 13.1.2, and 13.2.1 (all part of Test Method 1071).
For MIL-STD-750-2, Mechanical Test Methods 2001 through 2999, the new update is Change 3. This change modifies several test method in order to bring them in line with MIL-STD-883. The test methods that have been changed are 2006 (paragraph 3), 2056 (paragraph 3.2.2), and 2057 (paragraphs 3.3 and 3.4).
All of these updates are released as interfiled editions. This means that the standard plus all changes is republished in 1 document, with the changed language already included. It is helpful in that the user doesn’t have to make the changes by hand, but it can sometimes make the identification of changes more difficult. In the case of the MIL-STD-750 series, the summary of changes at the beginning of the revised documents is most helpful.
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